- Tytuł :
- Sample processing by Bi‐FIB for in situ TOF‐SIMS imaging of buried interfaces
- Autorzy :
- Temat :
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Materials Chemistry
Surfaces and Interfaces
General Chemistry
Condensed Matter Physics
Surfaces, Coatings and Films - Źródło :
- Surface and Interface Analysis. 55:209-214
- Dostęp URL :
-
https://explore.openaire.eu/search/publication?articleId=doi_________::f1a84f1a8e7a4398c4e81b5a56c1db12
https://doi.org/10.1002/sia.7179